MoniTEM is a light-weight monitoring system for FEI transmission electron microscopes (Tecnai and possibly Titan) developed by Matthias Brunner and Günter Resch at the IMP-IMBA Electron Microscopy Facility, Vienna, Austria.

It is designed to increase the uptime of these instruments by constantly monitoring critical system parameters such as vacuum, high tension, CompuStage, .... In case of a failure, MoniTEM takes a passive approach alerting the system supervisor(s) by email and/or mobile phone text message for immediate problem solving. In parallel or alternatively, MoniTEM can be used for continuously logging these parameters as a background process.

For in-depth information about MoniTEM, please refer to Brunner, M. J., and Resch, G. P. (2009): Automated monitoring to reduce electron microscope downtime. Ultramicroscopy 109, 1389–1392.

MoniTEM 1.0.1 (released August 28, 2009) including documentation and sample configuration files is available for free download from this site (zip archive, 288 kB).